
MACOM II®
Magnetic field compensation for optimal interference reduction
Significant reduction of magnetic interference fields in electron beam lithography and electron microscopy thanks to the MACOM II® active magnetic field compensation system.
Your Benefits
✔ Effective interference field reduction: Maximum field reduction performance with extremely low noise levels – for highest precision in sensitive applications
✔ Maximum operational efficiency: Individually configurable for a wide range of applications – from research to industry
✔ Flexible system solutions: Magnetic field compensation for optimal interference field reduction
Typical areas of application
- Research: Electron microscopy – improving resolution by reducing magnetic interference fields.
- Semiconductor industry: Electron beam lithography – magnetic field reduction for precise structures in the nanometre range
- General applications: All types of equipment – stable magnetic field conditions for trouble-free operation of sensitive systems

Technical Data
Field reduction performance* | 0.1 Hz to 1 kHz: 60 dB 1 kHz to 5 kHz: 60 dB to 40 dB 5 kHz to 100 kHz: 40 dB to 0 dB |
Dynamic range | > 100 dB |
Noise (0.1 Hz – 10 kHz)* | < 0.2 nTRMS |
Long-term stability | < 1 nTRMS |
Maximum interference field | approx. 10 µT |
Output current | 3 x 3 A |
PC interface | RS 232, Ethernet |
Power supply | 115 V or 230 V (adjustable), 50 Hz or 60 Hz |
Form factor | 19" (4 U) – rack-mount or desktop housing |
*Typical values at the probe location
Choose MACOM II® for stable magnetic fields and maximum precision
in research and semiconductor technology!
Downloads
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Brochure Magnetic field compensation (German)
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Handout Magnetic field compensation (German)
Any Questions?
Ivan Madzarevic looks forward to your call at
+49 (89) 85602-378 or feel free to send us a message.