MACOM II®

Magnetic field compensation for optimal interference reduction

Significant reduction of magnetic interference fields in electron beam lithography and electron microscopy thanks to the MACOM II® active magnetic field compensation system.

Your Benefits

Effective interference field reduction: Maximum field reduction performance with extremely low noise levels – for highest precision in sensitive applications

Maximum operational efficiency: Individually configurable for a wide range of applications – from research to industry

Flexible system solutions: Magnetic field compensation for optimal interference field reduction

Typical areas of application

  • Research: Electron microscopy – improving resolution by reducing magnetic interference fields.
  • Semiconductor industry: Electron beam lithography – magnetic field reduction for precise structures in the nanometre range
  • General applications: All types of equipment – stable magnetic field conditions for trouble-free operation of sensitive systems

Technical Data

Field reduction performance*0.1 Hz to 1 kHz: 60 dB
1 kHz to 5 kHz: 60 dB to 40 dB
5 kHz to 100 kHz: 40 dB to 0 dB
Dynamic range> 100 dB
Noise (0.1 Hz – 10 kHz)*< 0.2 nTRMS
Long-term stability< 1 nTRMS
Maximum interference fieldapprox. 10 µT
Output current3 x 3 A
PC interfaceRS 232, Ethernet
Power supply115 V or 230 V (adjustable), 50 Hz or 60 Hz
Form factor19" (4 U) – rack-mount or desktop housing

*Typical values at the probe location

Choose MACOM II® for stable magnetic fields and maximum precision 
in research and semiconductor technology!

Get in touch now!

Any Questions?
Ivan Madzarevic looks forward to your call at
+49 (89) 85602-378 or feel free to send us a message.